Reliable Scanning Electron Microscopy & Composition Analysis
CMI has extensive experience in providing accurate and thorough scanning electron microscopy and composition analysis. Based in Hartford, Connecticut, you can rely on our scientists to help you get the information you need.
Scanning Electron Microscopy
Our JEOL T330A scanning electron microscope (SEM) features energy dispersive spectroscopy (EDS) analysis. It uses an advanced analysis technologies 4 pi EDS analysis system.
Capabilities Include:
Fractographic Evaluations at High Magnification Digital Imaging including Dimensional Evaluation & Particle Sizing Semi-Quantitative Composition Analysis Light Element Detection & Analysis
EDS (Energy Dispersive Spectroscopy) Analysis of Specified Multiple Points & Defined Areas within a Defined Field Dot Mapping of Regions to Determine Presence of Specified Elements Line Scan Capabilities to Detect Changes in Relative Concentrations
Composition Analysis
Experience is key when it comes to analytical chemistry. Our chemists combine their years of experience with modern techniques and equipment to provide accurate, reliable results. They have experience and knowledge involving many types of materials, including metals, polymers, residues, and deposits.
Fractographic Evaluations at High Magnification