Connecticut Metallurgical Inc.

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Composition & Electron Microscopy

Reliable Scanning Electron Microscopy & Composition Analysis

CMI has extensive experience in providing accurate and thorough scanning electron microscopy and composition analysis. Based in Hartford, Connecticut, you can rely on our scientists to help you get the information you need.

Scanning Electron Microscopy

Scanning Electron Microscopy

Our JEOL T330A scanning electron microscope (SEM) features energy dispersive spectroscopy (EDS) analysis. It uses an advanced analysis technologies 4 pi EDS analysis system.

Capabilities Include:
Fractographic Evaluations at High Magnification
Digital Imaging including Dimensional Evaluation & Particle Sizing
Semi-Quantitative Composition Analysis
Light Element Detection & Analysis
EDS (Energy Dispersive Spectroscopy) Analysis of Specified Multiple Points & Defined Areas within a Defined Field
Dot Mapping of Regions to Determine Presence of Specified Elements
Line Scan Capabilities to Detect Changes in Relative Concentrations

Composition Analysis

Experience is key when it comes to analytical chemistry. Our chemists combine their years of experience with modern techniques and equipment to provide accurate, reliable results. They have experience and knowledge involving many types of materials, including metals, polymers, residues, and deposits.

Techniques Used

Semi-Quantitative & Full Quantitative Analysis
ICP (Inductively Coupled Plasma/Atomic Emission Spectrometer)
Carbon & Sulfur Analysis (by Combustion)
Gas Analysis (Oxygen & Nitrogen)
Wet Chemistry (Special Methods, Deposit Loading)
FTIR (Fourier Transform Infrared Spectrometer)

Materials Analyzed

Carbon & Alloy Steels
Cobalt Alloys
Nickel Base Super Alloys
Stainless Steels
Tool Steels