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Scanning Electron Microscopy

Our JEOL T330A scanning electron microscope (SEM) features energy dispersive spectroscopy (EDS) analysis using an Advanced Analysis Technologies 4 Pi EDS analysis system.

Capabilities Include:

  • Fractographic evaluations at high magnification.

  • Digital imaging including dimensional evaluation and particle sizing.

  • Semi-quantitative composition analysis.

  • Light element detection and analysis.

  • EDS analysis of specified multiple points and defined areas within a defined field.

  • Dot mapping of regions to determine presence of specified elements.

  • Line scan capabilities to detect changes in relative concentrations.

   
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